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| Environmental Technology Listing |
Title of Listing: | | Opti-Thin EDXRF |
Category: | | Characterization Technologies |
Subcategory: | * | Water, Waste, Soil, All Listings |
Media: | | Soil, Sludge, Sediment, Water |
Contaminants: | | PCBs, Heavy Metals, Radioactive Metals, Nonmetallic Toxic Elements |
Web Site: | | |
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Technology Description: | |
The Opti-Thin EDXRF offers advances in transportable energy dispersive x-ray fluorescence analysis that include optimal sample presentation with matching calibration and quantitative analysis software and minor modification to commercially available systems that enable highly sensitive trace element analysis in the field in near realtime for contaminant metals:
- In solutions to low ppb
- In solids/soils to low ppm
- All elements simultaneously from Na to Pu
- Minimized sample prep (no acid digestion needed)
- Very wide dynamic range (ppb or ppm to weight %)
- Better signal/noise improves sensitivity and accuracy vs conventional energy dispersive x-ray fluorescence (EDXRF) methods
Completely unique capability to handle "total unknown," uses same calibration standards for analysis of liquids and solids. Particularly appropriate for analysis of metals in radioactive wastes since "micro" samples (microliters of solution or milligrams of solid) are effectively analyzed. Target contaminants include any contaminant where a particular element is a reliable indicator based on known stoichiometry (e.g. there are situations where the measurement of the chlorine content of a liquid or contaminated soil will indicate the presence and amount of PCBs).
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Performance Status/
Limitations: | |
Performance Status:
Successful application to a broad variety of environmental and industrial samples that include liquids, solids, and air filters. Initial discovery 1986, (partially) patented 1/94.
Limitations:
Does not analyze lightest elements, atomic number 1 to 10 (Hydrogen to Neon). Proper sample prep of solids is essential to avoid "particle effects," which cause errors due to selective absorption (thus change in fluorescence yield) due to insufficient homogenization (fine grinding or sifting) of the sample. Wastes mixed with ores provide the most difficult challenge for EDXRF analysis of certain trace metals, e.g., finding trace levels of cobalt in an iron ore is very difficult.
The Advanced Analytical Products & Services (AAP&S) EDXRF has interferences similar to conventional EDXRF (e.g., same line overlaps and instrument measurement effects), but some interferences are lessened because sample matrix effects are minimized and signal to noise improved with optimized thin sample presentation (and specialized calibration, spectrum processing, and quantitation software).
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Topics
Analytical Testing, Technologies, Characterization
Additional Topics/Tags/Keywords
X-Ray Fluorescence, Metals, Monitor |
Organization: | | Advanced Analytical Products & Services |
Address: | | 1753 Cape Aston Court
| Phone: | Description | Number |
City: | | San Jose | | Primary | (408) 926-4057 |
State/Province/Territory: | | CA | 2. | | |
Zip/Postal Code: | | 95133-1128 | 3. | | |
Country: | | United States | 4. | Fax: | (408) 926-4057 |
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